BAT-Scanner Large 3D Visual EMI Near Field Test System测试系统

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Home >EMC & RF Products>Near Field Scan>3D Near Field Scanner

3D Near Field Scanner

BAT-Scanner Large 3D Visual EMI Near Field Test System测试系统

BAT-Scanner

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Description

Near-field scanning is a widely used method for small EUT, PCB board or IC of radiation emission measurement. Bat-scanner is formally designed based on this method, it is the world's first 3D Visual EMI test solution compatible with the IEC61967-1-1 standard.

Application: PCB, IC, small size products radiation emission measurement, R & D positioning&rectification.